2 files changed, 22 insertions, 0 deletions

diff --git a/Documentation/ABI/testing/sysfs-class-mtd b/Documentation/ABI/testing/sysfs-class-mtd
index 4d55a1888981..43d18180b46e 100644
--- a/Documentation/ABI/testing/sysfs-class-mtd
+++ b/Documentation/ABI/testing/sysfs-class-mtd
@@ -123,3 +123,15 @@ Description:
                 half page, or a quarter page).
 
                 In the case of ECC NOR, it is the ECC block size.
+
+What:           /sys/class/mtd/mtdX/ecc_strength
+Date:           April 2012
+KernelVersion:  3.4
+Contact:        linux-mtd@lists.infradead.org
+Description:
+                Maximum number of bit errors that the device is capable of
+                correcting within each region covering an ecc step.  This will
+                always be a non-negative integer.  Note that some devices will
+                have multiple ecc steps within each writesize region.
+
+                In the case of devices lacking any ECC capability, it is 0.
diff --git a/drivers/mtd/mtdcore.c b/drivers/mtd/mtdcore.c
index c837507dfb1c..090e849d3dcd 100644
--- a/drivers/mtd/mtdcore.c
+++ b/drivers/mtd/mtdcore.c
@@ -250,6 +250,15 @@ static ssize_t mtd_name_show(struct device *dev,
 }
 static DEVICE_ATTR(name, S_IRUGO, mtd_name_show, NULL);
 
+static ssize_t mtd_ecc_strength_show(struct device *dev,
+                                     struct device_attribute *attr, char *buf)
+{
+        struct mtd_info *mtd = dev_get_drvdata(dev);
+
+        return snprintf(buf, PAGE_SIZE, "%u\n", mtd->ecc_strength);
+}
+static DEVICE_ATTR(ecc_strength, S_IRUGO, mtd_ecc_strength_show, NULL);
+
 static struct attribute *mtd_attrs[] = {
         &dev_attr_type.attr,
         &dev_attr_flags.attr,
@@ -260,6 +269,7 @@ static struct attribute *mtd_attrs[] = {
         &dev_attr_oobsize.attr,
         &dev_attr_numeraseregions.attr,
         &dev_attr_name.attr,
+        &dev_attr_ecc_strength.attr,
         NULL,
 };