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authorLuo Andy <yifei.luo@intel.com>2010-11-22 21:41:21 -0500
committerGreg Kroah-Hartman <gregkh@suse.de>2010-11-30 19:50:36 -0500
commit7fc56f0d9908fe140a01387d59954e3d0a2e7744 (patch)
tree88cbdeeacff090643c8b2dc6e44df82b2d1f2b6b /include
parentb23f2f94136884ebeb1b5e2196f4a53086444afa (diff)
usb: gadget: langwell_udc: add usb test mode support
This patch adds test mode support for Langwell gadget driver. Signed-off-by: Henry Yuan <hang.yuan@intel.com> Signed-off-by: Andy Luo <yifei.luo@intel.com> Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>
Diffstat (limited to 'include')
-rw-r--r--include/linux/usb/ch9.h10
1 files changed, 10 insertions, 0 deletions
diff --git a/include/linux/usb/ch9.h b/include/linux/usb/ch9.h
index f917bbbc8901..ab461948b579 100644
--- a/include/linux/usb/ch9.h
+++ b/include/linux/usb/ch9.h
@@ -124,6 +124,16 @@
124#define USB_DEVICE_DEBUG_MODE 6 /* (special devices only) */ 124#define USB_DEVICE_DEBUG_MODE 6 /* (special devices only) */
125 125
126/* 126/*
127 * Test Mode Selectors
128 * See USB 2.0 spec Table 9-7
129 */
130#define TEST_J 1
131#define TEST_K 2
132#define TEST_SE0_NAK 3
133#define TEST_PACKET 4
134#define TEST_FORCE_EN 5
135
136/*
127 * New Feature Selectors as added by USB 3.0 137 * New Feature Selectors as added by USB 3.0
128 * See USB 3.0 spec Table 9-6 138 * See USB 3.0 spec Table 9-6
129 */ 139 */