IIO: core: Modify scan element type

The current scan element type uses the following format:
  [be|le]:[s|u]bits/storagebits[>>shift].
To specify multiple elements in this type, added a repeat value.
So new format is:
  [be|le]:[s|u]bits/storagebitsXr[>>shift].
Here r is specifying how may times, real/storage bits are repeating.

When X is value is 0 or 1, then repeat value is not used in the format,
and it will be same as existing format.

Signed-off-by: Srinivas Pandruvada <srinivas.pandruvada@linux.intel.com>
Signed-off-by: Jonathan Cameron <jic23@kernel.org>

1 files changed, 7 insertions, 0 deletions

diff --git a/include/linux/iio/iio.h b/include/linux/iio/iio.h
index 5629c92eeadf..ccde91725f98 100644
--- a/include/linux/iio/iio.h
+++ b/include/linux/iio/iio.h
@@ -177,6 +177,12 @@ struct iio_event_spec {
  *                      shift:          Shift right by this before masking out
  *                                      realbits.
  *                      endianness:     little or big endian
+ *                      repeat:         Number of times real/storage bits
+ *                                      repeats. When the repeat element is
+ *                                      more than 1, then the type element in
+ *                                      sysfs will show a repeat value.
+ *                                      Otherwise, the number of repetitions is
+ *                                      omitted.
  * @info_mask_separate: What information is to be exported that is specific to
  *                      this channel.
  * @info_mask_shared_by_type: What information is to be exported that is shared
@@ -219,6 +225,7 @@ struct iio_chan_spec {
                 u8      realbits;
                 u8      storagebits;
                 u8      shift;
+                u8      repeat;
                 enum iio_endian endianness;
         } scan_type;
         long                    info_mask_separate;