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authorSylwester Nawrocki <s.nawrocki@samsung.com>2013-03-14 06:01:24 -0400
committerMauro Carvalho Chehab <mchehab@redhat.com>2013-03-31 09:55:19 -0400
commitfc39f46b54b600f053bf9bab757023344e97925e (patch)
tree43c702bd3b9f5d6765a0f67c5f03ec3ae2d57a41 /Documentation/DocBook
parent4163851f7b997e24602cad8e0eae96d31a252548 (diff)
[media] V4L: Add MATRIX option to V4L2_CID_EXPOSURE_METERING control
This patch adds a menu option to the V4L2_CID_EXPOSURE_METERING control for multi-zone metering. Signed-off-by: Sylwester Nawrocki <s.nawrocki@samsung.com> Signed-off-by: Kyungmin Park <kyungmin.park@samsung.com> Signed-off-by: Mauro Carvalho Chehab <mchehab@redhat.com>
Diffstat (limited to 'Documentation/DocBook')
-rw-r--r--Documentation/DocBook/media/v4l/controls.xml7
1 files changed, 7 insertions, 0 deletions
diff --git a/Documentation/DocBook/media/v4l/controls.xml b/Documentation/DocBook/media/v4l/controls.xml
index c8eb6c222274..8d7a77928d49 100644
--- a/Documentation/DocBook/media/v4l/controls.xml
+++ b/Documentation/DocBook/media/v4l/controls.xml
@@ -3142,6 +3142,13 @@ giving priority to the center of the metered area.</entry>
3142 <entry><constant>V4L2_EXPOSURE_METERING_SPOT</constant>&nbsp;</entry> 3142 <entry><constant>V4L2_EXPOSURE_METERING_SPOT</constant>&nbsp;</entry>
3143 <entry>Measure only very small area at the center of the frame.</entry> 3143 <entry>Measure only very small area at the center of the frame.</entry>
3144 </row> 3144 </row>
3145 <row>
3146 <entry><constant>V4L2_EXPOSURE_METERING_MATRIX</constant>&nbsp;</entry>
3147 <entry>A multi-zone metering. The light intensity is measured
3148in several points of the frame and the the results are combined. The
3149algorithm of the zones selection and their significance in calculating the
3150final value is device dependant.</entry>
3151 </row>
3145 </tbody> 3152 </tbody>
3146 </entrytbl> 3153 </entrytbl>
3147 </row> 3154 </row>