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authorBruce Allan <bruce.w.allan@intel.com>2012-12-05 01:25:36 -0500
committerJeff Kirsher <jeffrey.t.kirsher@intel.com>2013-01-27 03:19:19 -0500
commita8fc18910b7f35a59345b5f5cd140c7f64d57d86 (patch)
treebf0229abc859a33c21348bc45cfd5314aa0b8366
parent031554eab078705edb96e9a39665597e3fd22781 (diff)
e1000e: fix ethtool offline register test for I217
The SHRAH[9] register on I217 has a different R/W bit-mask than RAR and SHRAL/H registers. Set R/W bit-mask appropriately for SHRAH[9] when testing the R/W ability of the register. Also, fix the error message log format so that it does not provide misleading information (i.e. the logged register address could be incorrect). Signed-off-by: Bruce Allan <bruce.w.allan@intel.com> Tested-by: Jeff Pieper <jeffrey.e.pieper@intel.com> Signed-off-by: Jeff Kirsher <jeffrey.t.kirsher@intel.com>
-rw-r--r--drivers/net/ethernet/intel/e1000e/ethtool.c25
1 files changed, 17 insertions, 8 deletions
diff --git a/drivers/net/ethernet/intel/e1000e/ethtool.c b/drivers/net/ethernet/intel/e1000e/ethtool.c
index f268cbcb751d..ceff1bf300b3 100644
--- a/drivers/net/ethernet/intel/e1000e/ethtool.c
+++ b/drivers/net/ethernet/intel/e1000e/ethtool.c
@@ -760,8 +760,9 @@ static bool reg_pattern_test(struct e1000_adapter *adapter, u64 *data,
760 (test[pat] & write)); 760 (test[pat] & write));
761 val = E1000_READ_REG_ARRAY(&adapter->hw, reg, offset); 761 val = E1000_READ_REG_ARRAY(&adapter->hw, reg, offset);
762 if (val != (test[pat] & write & mask)) { 762 if (val != (test[pat] & write & mask)) {
763 e_err("pattern test reg %04X failed: got 0x%08X expected 0x%08X\n", 763 e_err("pattern test failed (reg 0x%05X): got 0x%08X expected 0x%08X\n",
764 reg + offset, val, (test[pat] & write & mask)); 764 reg + (offset << 2), val,
765 (test[pat] & write & mask));
765 *data = reg; 766 *data = reg;
766 return 1; 767 return 1;
767 } 768 }
@@ -776,7 +777,7 @@ static bool reg_set_and_check(struct e1000_adapter *adapter, u64 *data,
776 __ew32(&adapter->hw, reg, write & mask); 777 __ew32(&adapter->hw, reg, write & mask);
777 val = __er32(&adapter->hw, reg); 778 val = __er32(&adapter->hw, reg);
778 if ((write & mask) != (val & mask)) { 779 if ((write & mask) != (val & mask)) {
779 e_err("set/check reg %04X test failed: got 0x%08X expected 0x%08X\n", 780 e_err("set/check test failed (reg 0x%05X): got 0x%08X expected 0x%08X\n",
780 reg, (val & mask), (write & mask)); 781 reg, (val & mask), (write & mask));
781 *data = reg; 782 *data = reg;
782 return 1; 783 return 1;
@@ -884,12 +885,20 @@ static int e1000_reg_test(struct e1000_adapter *adapter, u64 *data)
884 E1000_FWSM_WLOCK_MAC_SHIFT; 885 E1000_FWSM_WLOCK_MAC_SHIFT;
885 886
886 for (i = 0; i < mac->rar_entry_count; i++) { 887 for (i = 0; i < mac->rar_entry_count; i++) {
887 /* Cannot test write-protected SHRAL[n] registers */ 888 if (mac->type == e1000_pch_lpt) {
888 if ((wlock_mac == 1) || (wlock_mac && (i > wlock_mac))) 889 /* Cannot test write-protected SHRAL[n] registers */
889 continue; 890 if ((wlock_mac == 1) || (wlock_mac && (i > wlock_mac)))
891 continue;
892
893 /* SHRAH[9] different than the others */
894 if (i == 10)
895 mask |= (1 << 30);
896 else
897 mask &= ~(1 << 30);
898 }
890 899
891 REG_PATTERN_TEST_ARRAY(E1000_RA, ((i << 1) + 1), 900 REG_PATTERN_TEST_ARRAY(E1000_RA, ((i << 1) + 1), mask,
892 mask, 0xFFFFFFFF); 901 0xFFFFFFFF);
893 } 902 }
894 903
895 for (i = 0; i < mac->mta_reg_count; i++) 904 for (i = 0; i < mac->mta_reg_count; i++)