Merge tag 'libnvdimm-fixes-4.20-rc3' of git://git.kernel.org/pub/scm/linux/kernel/git/nvdimm/nvdimm

Pull libnvdimm fixes from Dan Williams:
 "A small batch of fixes for v4.20-rc3.

  The overflow continuation fix addresses something that has been broken
  for several releases. Arguably it could wait even longer, but it's a
  one line fix and this finishes the last of the known address range
  scrub bug reports. The revert addresses a lockdep regression. The unit
  tests are not critical to fix, but no reason to hold this fix back.

  Summary:

   - Address Range Scrub overflow continuation handling has been broken
     since it was initially merged. It was only recently that error
     injection and platform-BIOS support enabled this corner case to be
     exercised.

   - The recent attempt to provide more isolation for the kernel Address
     Range Scrub state machine from userapace initiated sessions
     triggers a lockdep report. Revert and try again at the next merge
     window.

   - Fix a kasan reported buffer overflow in libnvdimm unit test
     infrastrucutre (nfit_test)"

* tag 'libnvdimm-fixes-4.20-rc3' of git://git.kernel.org/pub/scm/linux/kernel/git/nvdimm/nvdimm:
  Revert "acpi, nfit: Further restrict userspace ARS start requests"
  acpi, nfit: Fix ARS overflow continuation
  tools/testing/nvdimm: Fix the array size for dimm devices.

1 files changed, 4 insertions, 4 deletions

diff --git a/tools/testing/nvdimm/test/nfit.c b/tools/testing/nvdimm/test/nfit.c
index 9527d47a1070..01ec04bf91b5 100644
--- a/tools/testing/nvdimm/test/nfit.c
+++ b/tools/testing/nvdimm/test/nfit.c
@@ -140,8 +140,8 @@ static u32 handle[] = {
         [6] = NFIT_DIMM_HANDLE(1, 0, 0, 0, 1),
 };
 
-static unsigned long dimm_fail_cmd_flags[NUM_DCR];
-static int dimm_fail_cmd_code[NUM_DCR];
+static unsigned long dimm_fail_cmd_flags[ARRAY_SIZE(handle)];
+static int dimm_fail_cmd_code[ARRAY_SIZE(handle)];
 
 static const struct nd_intel_smart smart_def = {
         .flags = ND_INTEL_SMART_HEALTH_VALID
@@ -205,7 +205,7 @@ struct nfit_test {
                 unsigned long deadline;
                 spinlock_t lock;
         } ars_state;
-        struct device *dimm_dev[NUM_DCR];
+        struct device *dimm_dev[ARRAY_SIZE(handle)];
         struct nd_intel_smart *smart;
         struct nd_intel_smart_threshold *smart_threshold;
         struct badrange badrange;
@@ -2680,7 +2680,7 @@ static int nfit_test_probe(struct platform_device *pdev)
                 u32 nfit_handle = __to_nfit_memdev(nfit_mem)->device_handle;
                 int i;
 
-                for (i = 0; i < NUM_DCR; i++)
+                for (i = 0; i < ARRAY_SIZE(handle); i++)
                         if (nfit_handle == handle[i])
                                 dev_set_drvdata(nfit_test->dimm_dev[i],
                                                 nfit_mem);