tools/testing/nvdimm: Populate dirty shutdown data

Allow the unit tests to verify the retrieval of the dirty shutdown
count via smart commands, and allow the driver-load-time retrieval of
the smart health payload to be simulated by nfit_test.

Reviewed-by: Keith Busch <keith.busch@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>

1 files changed, 5 insertions, 2 deletions

diff --git a/drivers/acpi/nfit/core.c b/drivers/acpi/nfit/core.c
index bf7021bb276c..ec8fb578fa36 100644
--- a/drivers/acpi/nfit/core.c
+++ b/drivers/acpi/nfit/core.c
@@ -1721,7 +1721,7 @@ static bool acpi_nvdimm_has_method(struct acpi_device *adev, char *method)
         return false;
 }
 
-static void nfit_intel_shutdown_status(struct nfit_mem *nfit_mem)
+__weak void nfit_intel_shutdown_status(struct nfit_mem *nfit_mem)
 {
         struct nd_intel_smart smart = { 0 };
         union acpi_object in_buf = {
@@ -1785,8 +1785,11 @@ static int acpi_nfit_add_dimm(struct acpi_nfit_desc *acpi_desc,
         nfit_mem->dsm_mask = acpi_desc->dimm_cmd_force_en;
         nfit_mem->family = NVDIMM_FAMILY_INTEL;
         adev = to_acpi_dev(acpi_desc);
-        if (!adev)
+        if (!adev) {
+                /* unit test case */
+                populate_shutdown_status(nfit_mem);
                 return 0;
+        }
 
         adev_dimm = acpi_find_child_device(adev, device_handle, false);
         nfit_mem->adev = adev_dimm;