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Diffstat (limited to 'include/asm-sparc/estate.h')
| -rw-r--r-- | include/asm-sparc/estate.h | 49 |
1 files changed, 0 insertions, 49 deletions
diff --git a/include/asm-sparc/estate.h b/include/asm-sparc/estate.h deleted file mode 100644 index 520c08560d1b..000000000000 --- a/include/asm-sparc/estate.h +++ /dev/null | |||
| @@ -1,49 +0,0 @@ | |||
| 1 | #ifndef _SPARC64_ESTATE_H | ||
| 2 | #define _SPARC64_ESTATE_H | ||
| 3 | |||
| 4 | /* UltraSPARC-III E-cache Error Enable */ | ||
| 5 | #define ESTATE_ERROR_FMT 0x0000000000040000 /* Force MTAG ECC */ | ||
| 6 | #define ESTATE_ERROR_FMESS 0x000000000003c000 /* Forced MTAG ECC val */ | ||
| 7 | #define ESTATE_ERROR_FMD 0x0000000000002000 /* Force DATA ECC */ | ||
| 8 | #define ESTATE_ERROR_FDECC 0x0000000000001ff0 /* Forced DATA ECC val */ | ||
| 9 | #define ESTATE_ERROR_UCEEN 0x0000000000000008 /* See below */ | ||
| 10 | #define ESTATE_ERROR_NCEEN 0x0000000000000002 /* See below */ | ||
| 11 | #define ESTATE_ERROR_CEEN 0x0000000000000001 /* See below */ | ||
| 12 | |||
| 13 | /* UCEEN enables the fast_ECC_error trap for: 1) software correctable E-cache | ||
| 14 | * errors 2) uncorrectable E-cache errors. Such events only occur on reads | ||
| 15 | * of the E-cache by the local processor for: 1) data loads 2) instruction | ||
| 16 | * fetches 3) atomic operations. Such events _cannot_ occur for: 1) merge | ||
| 17 | * 2) writeback 2) copyout. The AFSR bits associated with these traps are | ||
| 18 | * UCC and UCU. | ||
| 19 | */ | ||
| 20 | |||
| 21 | /* NCEEN enables instruction_access_error, data_access_error, and ECC_error traps | ||
| 22 | * for uncorrectable ECC errors and system errors. | ||
| 23 | * | ||
| 24 | * Uncorrectable system bus data error or MTAG ECC error, system bus TimeOUT, | ||
| 25 | * or system bus BusERR: | ||
| 26 | * 1) As the result of an instruction fetch, will generate instruction_access_error | ||
| 27 | * 2) As the result of a load etc. will generate data_access_error. | ||
| 28 | * 3) As the result of store merge completion, writeback, or copyout will | ||
| 29 | * generate a disrupting ECC_error trap. | ||
| 30 | * 4) As the result of such errors on instruction vector fetch can generate any | ||
| 31 | * of the 3 trap types. | ||
| 32 | * | ||
| 33 | * The AFSR bits associated with these traps are EMU, EDU, WDU, CPU, IVU, UE, | ||
| 34 | * BERR, and TO. | ||
| 35 | */ | ||
| 36 | |||
| 37 | /* CEEN enables the ECC_error trap for hardware corrected ECC errors. System bus | ||
| 38 | * reads resulting in a hardware corrected data or MTAG ECC error will generate an | ||
| 39 | * ECC_error disrupting trap with this bit enabled. | ||
| 40 | * | ||
| 41 | * This same trap will also be generated when a hardware corrected ECC error results | ||
| 42 | * during store merge, writeback, and copyout operations. | ||
| 43 | */ | ||
| 44 | |||
| 45 | /* In general, if the trap enable bits above are disabled the AFSR bits will still | ||
| 46 | * log the events even though the trap will not be generated by the processor. | ||
| 47 | */ | ||
| 48 | |||
| 49 | #endif /* _SPARC64_ESTATE_H */ | ||
