1 files changed, 52 insertions, 0 deletions

diff --git a/Documentation/ABI/testing/sysfs-class-mtd b/Documentation/ABI/testing/sysfs-class-mtd
index 4d55a1888981..938ef71e2035 100644
--- a/Documentation/ABI/testing/sysfs-class-mtd
+++ b/Documentation/ABI/testing/sysfs-class-mtd
@@ -123,3 +123,55 @@ Description:
                 half page, or a quarter page).
 
                 In the case of ECC NOR, it is the ECC block size.
+
+What:           /sys/class/mtd/mtdX/ecc_strength
+Date:           April 2012
+KernelVersion:  3.4
+Contact:        linux-mtd@lists.infradead.org
+Description:
+                Maximum number of bit errors that the device is capable of
+                correcting within each region covering an ecc step.  This will
+                always be a non-negative integer.  Note that some devices will
+                have multiple ecc steps within each writesize region.
+
+                In the case of devices lacking any ECC capability, it is 0.
+
+What:           /sys/class/mtd/mtdX/bitflip_threshold
+Date:           April 2012
+KernelVersion:  3.4
+Contact:        linux-mtd@lists.infradead.org
+Description:
+                This allows the user to examine and adjust the criteria by which
+                mtd returns -EUCLEAN from mtd_read() and mtd_read_oob().  If the
+                maximum number of bit errors that were corrected on any single
+                region comprising an ecc step (as reported by the driver) equals
+                or exceeds this value, -EUCLEAN is returned.  Otherwise, absent
+                an error, 0 is returned.  Higher layers (e.g., UBI) use this
+                return code as an indication that an erase block may be
+                degrading and should be scrutinized as a candidate for being
+                marked as bad.
+
+                The initial value may be specified by the flash device driver.
+                If not, then the default value is ecc_strength.
+
+                The introduction of this feature brings a subtle change to the
+                meaning of the -EUCLEAN return code.  Previously, it was
+                interpreted to mean simply "one or more bit errors were
+                corrected".  Its new interpretation can be phrased as "a
+                dangerously high number of bit errors were corrected on one or
+                more regions comprising an ecc step".  The precise definition of
+                "dangerously high" can be adjusted by the user with
+                bitflip_threshold.  Users are discouraged from doing this,
+                however, unless they know what they are doing and have intimate
+                knowledge of the properties of their device.  Broadly speaking,
+                bitflip_threshold should be low enough to detect genuine erase
+                block degradation, but high enough to avoid the consequences of
+                a persistent return value of -EUCLEAN on devices where sticky
+                bitflips occur.  Note that if bitflip_threshold exceeds
+                ecc_strength, -EUCLEAN is never returned by the read operations.
+                Conversely, if bitflip_threshold is zero, -EUCLEAN is always
+                returned, absent a hard error.
+
+                This is generally applicable only to NAND flash devices with ECC
+                capability.  It is ignored on devices lacking ECC capability;
+                i.e., devices for which ecc_strength is zero.