1 files changed, 14 insertions, 3 deletions

diff --git a/Documentation/ABI/testing/sysfs-class-mtd b/Documentation/ABI/testing/sysfs-class-mtd
index 3105644b3bfc..bfd119ace6ad 100644
--- a/Documentation/ABI/testing/sysfs-class-mtd
+++ b/Documentation/ABI/testing/sysfs-class-mtd
@@ -128,9 +128,8 @@ KernelVersion:	3.4
 Contact:        linux-mtd@lists.infradead.org
 Description:
                 Maximum number of bit errors that the device is capable of
-                correcting within each region covering an ecc step.  This will
-                always be a non-negative integer.  Note that some devices will
-                have multiple ecc steps within each writesize region.
+                correcting within each region covering an ECC step (see
+                ecc_step_size).  This will always be a non-negative integer.
 
                 In the case of devices lacking any ECC capability, it is 0.
 
@@ -173,3 +172,15 @@ Description:
                 This is generally applicable only to NAND flash devices with ECC
                 capability.  It is ignored on devices lacking ECC capability;
                 i.e., devices for which ecc_strength is zero.
+
+What:           /sys/class/mtd/mtdX/ecc_step_size
+Date:           May 2013
+KernelVersion:  3.10
+Contact:        linux-mtd@lists.infradead.org
+Description:
+                The size of a single region covered by ECC, known as the ECC
+                step.  Devices may have several equally sized ECC steps within
+                each writesize region.
+
+                It will always be a non-negative integer.  In the case of
+                devices lacking any ECC capability, it is 0.