diff options
author | Linus Torvalds <torvalds@ppc970.osdl.org> | 2005-04-16 18:20:36 -0400 |
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committer | Linus Torvalds <torvalds@ppc970.osdl.org> | 2005-04-16 18:20:36 -0400 |
commit | 1da177e4c3f41524e886b7f1b8a0c1fc7321cac2 (patch) | |
tree | 0bba044c4ce775e45a88a51686b5d9f90697ea9d /include/linux/mtd/nand.h |
Linux-2.6.12-rc2v2.6.12-rc2
Initial git repository build. I'm not bothering with the full history,
even though we have it. We can create a separate "historical" git
archive of that later if we want to, and in the meantime it's about
3.2GB when imported into git - space that would just make the early
git days unnecessarily complicated, when we don't have a lot of good
infrastructure for it.
Let it rip!
Diffstat (limited to 'include/linux/mtd/nand.h')
-rw-r--r-- | include/linux/mtd/nand.h | 469 |
1 files changed, 469 insertions, 0 deletions
diff --git a/include/linux/mtd/nand.h b/include/linux/mtd/nand.h new file mode 100644 index 000000000000..9a19c65abd74 --- /dev/null +++ b/include/linux/mtd/nand.h | |||
@@ -0,0 +1,469 @@ | |||
1 | /* | ||
2 | * linux/include/linux/mtd/nand.h | ||
3 | * | ||
4 | * Copyright (c) 2000 David Woodhouse <dwmw2@mvhi.com> | ||
5 | * Steven J. Hill <sjhill@realitydiluted.com> | ||
6 | * Thomas Gleixner <tglx@linutronix.de> | ||
7 | * | ||
8 | * $Id: nand.h,v 1.68 2004/11/12 10:40:37 gleixner Exp $ | ||
9 | * | ||
10 | * This program is free software; you can redistribute it and/or modify | ||
11 | * it under the terms of the GNU General Public License version 2 as | ||
12 | * published by the Free Software Foundation. | ||
13 | * | ||
14 | * Info: | ||
15 | * Contains standard defines and IDs for NAND flash devices | ||
16 | * | ||
17 | * Changelog: | ||
18 | * 01-31-2000 DMW Created | ||
19 | * 09-18-2000 SJH Moved structure out of the Disk-On-Chip drivers | ||
20 | * so it can be used by other NAND flash device | ||
21 | * drivers. I also changed the copyright since none | ||
22 | * of the original contents of this file are specific | ||
23 | * to DoC devices. David can whack me with a baseball | ||
24 | * bat later if I did something naughty. | ||
25 | * 10-11-2000 SJH Added private NAND flash structure for driver | ||
26 | * 10-24-2000 SJH Added prototype for 'nand_scan' function | ||
27 | * 10-29-2001 TG changed nand_chip structure to support | ||
28 | * hardwarespecific function for accessing control lines | ||
29 | * 02-21-2002 TG added support for different read/write adress and | ||
30 | * ready/busy line access function | ||
31 | * 02-26-2002 TG added chip_delay to nand_chip structure to optimize | ||
32 | * command delay times for different chips | ||
33 | * 04-28-2002 TG OOB config defines moved from nand.c to avoid duplicate | ||
34 | * defines in jffs2/wbuf.c | ||
35 | * 08-07-2002 TG forced bad block location to byte 5 of OOB, even if | ||
36 | * CONFIG_MTD_NAND_ECC_JFFS2 is not set | ||
37 | * 08-10-2002 TG extensions to nand_chip structure to support HW-ECC | ||
38 | * | ||
39 | * 08-29-2002 tglx nand_chip structure: data_poi for selecting | ||
40 | * internal / fs-driver buffer | ||
41 | * support for 6byte/512byte hardware ECC | ||
42 | * read_ecc, write_ecc extended for different oob-layout | ||
43 | * oob layout selections: NAND_NONE_OOB, NAND_JFFS2_OOB, | ||
44 | * NAND_YAFFS_OOB | ||
45 | * 11-25-2002 tglx Added Manufacturer code FUJITSU, NATIONAL | ||
46 | * Split manufacturer and device ID structures | ||
47 | * | ||
48 | * 02-08-2004 tglx added option field to nand structure for chip anomalities | ||
49 | * 05-25-2004 tglx added bad block table support, ST-MICRO manufacturer id | ||
50 | * update of nand_chip structure description | ||
51 | */ | ||
52 | #ifndef __LINUX_MTD_NAND_H | ||
53 | #define __LINUX_MTD_NAND_H | ||
54 | |||
55 | #include <linux/config.h> | ||
56 | #include <linux/wait.h> | ||
57 | #include <linux/spinlock.h> | ||
58 | #include <linux/mtd/mtd.h> | ||
59 | |||
60 | struct mtd_info; | ||
61 | /* Scan and identify a NAND device */ | ||
62 | extern int nand_scan (struct mtd_info *mtd, int max_chips); | ||
63 | /* Free resources held by the NAND device */ | ||
64 | extern void nand_release (struct mtd_info *mtd); | ||
65 | |||
66 | /* Read raw data from the device without ECC */ | ||
67 | extern int nand_read_raw (struct mtd_info *mtd, uint8_t *buf, loff_t from, size_t len, size_t ooblen); | ||
68 | |||
69 | |||
70 | /* The maximum number of NAND chips in an array */ | ||
71 | #define NAND_MAX_CHIPS 8 | ||
72 | |||
73 | /* This constant declares the max. oobsize / page, which | ||
74 | * is supported now. If you add a chip with bigger oobsize/page | ||
75 | * adjust this accordingly. | ||
76 | */ | ||
77 | #define NAND_MAX_OOBSIZE 64 | ||
78 | |||
79 | /* | ||
80 | * Constants for hardware specific CLE/ALE/NCE function | ||
81 | */ | ||
82 | /* Select the chip by setting nCE to low */ | ||
83 | #define NAND_CTL_SETNCE 1 | ||
84 | /* Deselect the chip by setting nCE to high */ | ||
85 | #define NAND_CTL_CLRNCE 2 | ||
86 | /* Select the command latch by setting CLE to high */ | ||
87 | #define NAND_CTL_SETCLE 3 | ||
88 | /* Deselect the command latch by setting CLE to low */ | ||
89 | #define NAND_CTL_CLRCLE 4 | ||
90 | /* Select the address latch by setting ALE to high */ | ||
91 | #define NAND_CTL_SETALE 5 | ||
92 | /* Deselect the address latch by setting ALE to low */ | ||
93 | #define NAND_CTL_CLRALE 6 | ||
94 | /* Set write protection by setting WP to high. Not used! */ | ||
95 | #define NAND_CTL_SETWP 7 | ||
96 | /* Clear write protection by setting WP to low. Not used! */ | ||
97 | #define NAND_CTL_CLRWP 8 | ||
98 | |||
99 | /* | ||
100 | * Standard NAND flash commands | ||
101 | */ | ||
102 | #define NAND_CMD_READ0 0 | ||
103 | #define NAND_CMD_READ1 1 | ||
104 | #define NAND_CMD_PAGEPROG 0x10 | ||
105 | #define NAND_CMD_READOOB 0x50 | ||
106 | #define NAND_CMD_ERASE1 0x60 | ||
107 | #define NAND_CMD_STATUS 0x70 | ||
108 | #define NAND_CMD_STATUS_MULTI 0x71 | ||
109 | #define NAND_CMD_SEQIN 0x80 | ||
110 | #define NAND_CMD_READID 0x90 | ||
111 | #define NAND_CMD_ERASE2 0xd0 | ||
112 | #define NAND_CMD_RESET 0xff | ||
113 | |||
114 | /* Extended commands for large page devices */ | ||
115 | #define NAND_CMD_READSTART 0x30 | ||
116 | #define NAND_CMD_CACHEDPROG 0x15 | ||
117 | |||
118 | /* Status bits */ | ||
119 | #define NAND_STATUS_FAIL 0x01 | ||
120 | #define NAND_STATUS_FAIL_N1 0x02 | ||
121 | #define NAND_STATUS_TRUE_READY 0x20 | ||
122 | #define NAND_STATUS_READY 0x40 | ||
123 | #define NAND_STATUS_WP 0x80 | ||
124 | |||
125 | /* | ||
126 | * Constants for ECC_MODES | ||
127 | */ | ||
128 | |||
129 | /* No ECC. Usage is not recommended ! */ | ||
130 | #define NAND_ECC_NONE 0 | ||
131 | /* Software ECC 3 byte ECC per 256 Byte data */ | ||
132 | #define NAND_ECC_SOFT 1 | ||
133 | /* Hardware ECC 3 byte ECC per 256 Byte data */ | ||
134 | #define NAND_ECC_HW3_256 2 | ||
135 | /* Hardware ECC 3 byte ECC per 512 Byte data */ | ||
136 | #define NAND_ECC_HW3_512 3 | ||
137 | /* Hardware ECC 3 byte ECC per 512 Byte data */ | ||
138 | #define NAND_ECC_HW6_512 4 | ||
139 | /* Hardware ECC 8 byte ECC per 512 Byte data */ | ||
140 | #define NAND_ECC_HW8_512 6 | ||
141 | /* Hardware ECC 12 byte ECC per 2048 Byte data */ | ||
142 | #define NAND_ECC_HW12_2048 7 | ||
143 | |||
144 | /* | ||
145 | * Constants for Hardware ECC | ||
146 | */ | ||
147 | /* Reset Hardware ECC for read */ | ||
148 | #define NAND_ECC_READ 0 | ||
149 | /* Reset Hardware ECC for write */ | ||
150 | #define NAND_ECC_WRITE 1 | ||
151 | /* Enable Hardware ECC before syndrom is read back from flash */ | ||
152 | #define NAND_ECC_READSYN 2 | ||
153 | |||
154 | /* Option constants for bizarre disfunctionality and real | ||
155 | * features | ||
156 | */ | ||
157 | /* Chip can not auto increment pages */ | ||
158 | #define NAND_NO_AUTOINCR 0x00000001 | ||
159 | /* Buswitdh is 16 bit */ | ||
160 | #define NAND_BUSWIDTH_16 0x00000002 | ||
161 | /* Device supports partial programming without padding */ | ||
162 | #define NAND_NO_PADDING 0x00000004 | ||
163 | /* Chip has cache program function */ | ||
164 | #define NAND_CACHEPRG 0x00000008 | ||
165 | /* Chip has copy back function */ | ||
166 | #define NAND_COPYBACK 0x00000010 | ||
167 | /* AND Chip which has 4 banks and a confusing page / block | ||
168 | * assignment. See Renesas datasheet for further information */ | ||
169 | #define NAND_IS_AND 0x00000020 | ||
170 | /* Chip has a array of 4 pages which can be read without | ||
171 | * additional ready /busy waits */ | ||
172 | #define NAND_4PAGE_ARRAY 0x00000040 | ||
173 | |||
174 | /* Options valid for Samsung large page devices */ | ||
175 | #define NAND_SAMSUNG_LP_OPTIONS \ | ||
176 | (NAND_NO_PADDING | NAND_CACHEPRG | NAND_COPYBACK) | ||
177 | |||
178 | /* Macros to identify the above */ | ||
179 | #define NAND_CANAUTOINCR(chip) (!(chip->options & NAND_NO_AUTOINCR)) | ||
180 | #define NAND_MUST_PAD(chip) (!(chip->options & NAND_NO_PADDING)) | ||
181 | #define NAND_HAS_CACHEPROG(chip) ((chip->options & NAND_CACHEPRG)) | ||
182 | #define NAND_HAS_COPYBACK(chip) ((chip->options & NAND_COPYBACK)) | ||
183 | |||
184 | /* Mask to zero out the chip options, which come from the id table */ | ||
185 | #define NAND_CHIPOPTIONS_MSK (0x0000ffff & ~NAND_NO_AUTOINCR) | ||
186 | |||
187 | /* Non chip related options */ | ||
188 | /* Use a flash based bad block table. This option is passed to the | ||
189 | * default bad block table function. */ | ||
190 | #define NAND_USE_FLASH_BBT 0x00010000 | ||
191 | /* The hw ecc generator provides a syndrome instead a ecc value on read | ||
192 | * This can only work if we have the ecc bytes directly behind the | ||
193 | * data bytes. Applies for DOC and AG-AND Renesas HW Reed Solomon generators */ | ||
194 | #define NAND_HWECC_SYNDROME 0x00020000 | ||
195 | |||
196 | |||
197 | /* Options set by nand scan */ | ||
198 | /* Nand scan has allocated oob_buf */ | ||
199 | #define NAND_OOBBUF_ALLOC 0x40000000 | ||
200 | /* Nand scan has allocated data_buf */ | ||
201 | #define NAND_DATABUF_ALLOC 0x80000000 | ||
202 | |||
203 | |||
204 | /* | ||
205 | * nand_state_t - chip states | ||
206 | * Enumeration for NAND flash chip state | ||
207 | */ | ||
208 | typedef enum { | ||
209 | FL_READY, | ||
210 | FL_READING, | ||
211 | FL_WRITING, | ||
212 | FL_ERASING, | ||
213 | FL_SYNCING, | ||
214 | FL_CACHEDPRG, | ||
215 | } nand_state_t; | ||
216 | |||
217 | /* Keep gcc happy */ | ||
218 | struct nand_chip; | ||
219 | |||
220 | /** | ||
221 | * struct nand_hw_control - Control structure for hardware controller (e.g ECC generator) shared among independend devices | ||
222 | * @lock: protection lock | ||
223 | * @active: the mtd device which holds the controller currently | ||
224 | */ | ||
225 | struct nand_hw_control { | ||
226 | spinlock_t lock; | ||
227 | struct nand_chip *active; | ||
228 | }; | ||
229 | |||
230 | /** | ||
231 | * struct nand_chip - NAND Private Flash Chip Data | ||
232 | * @IO_ADDR_R: [BOARDSPECIFIC] address to read the 8 I/O lines of the flash device | ||
233 | * @IO_ADDR_W: [BOARDSPECIFIC] address to write the 8 I/O lines of the flash device | ||
234 | * @read_byte: [REPLACEABLE] read one byte from the chip | ||
235 | * @write_byte: [REPLACEABLE] write one byte to the chip | ||
236 | * @read_word: [REPLACEABLE] read one word from the chip | ||
237 | * @write_word: [REPLACEABLE] write one word to the chip | ||
238 | * @write_buf: [REPLACEABLE] write data from the buffer to the chip | ||
239 | * @read_buf: [REPLACEABLE] read data from the chip into the buffer | ||
240 | * @verify_buf: [REPLACEABLE] verify buffer contents against the chip data | ||
241 | * @select_chip: [REPLACEABLE] select chip nr | ||
242 | * @block_bad: [REPLACEABLE] check, if the block is bad | ||
243 | * @block_markbad: [REPLACEABLE] mark the block bad | ||
244 | * @hwcontrol: [BOARDSPECIFIC] hardwarespecific function for accesing control-lines | ||
245 | * @dev_ready: [BOARDSPECIFIC] hardwarespecific function for accesing device ready/busy line | ||
246 | * If set to NULL no access to ready/busy is available and the ready/busy information | ||
247 | * is read from the chip status register | ||
248 | * @cmdfunc: [REPLACEABLE] hardwarespecific function for writing commands to the chip | ||
249 | * @waitfunc: [REPLACEABLE] hardwarespecific function for wait on ready | ||
250 | * @calculate_ecc: [REPLACEABLE] function for ecc calculation or readback from ecc hardware | ||
251 | * @correct_data: [REPLACEABLE] function for ecc correction, matching to ecc generator (sw/hw) | ||
252 | * @enable_hwecc: [BOARDSPECIFIC] function to enable (reset) hardware ecc generator. Must only | ||
253 | * be provided if a hardware ECC is available | ||
254 | * @erase_cmd: [INTERN] erase command write function, selectable due to AND support | ||
255 | * @scan_bbt: [REPLACEABLE] function to scan bad block table | ||
256 | * @eccmode: [BOARDSPECIFIC] mode of ecc, see defines | ||
257 | * @eccsize: [INTERN] databytes used per ecc-calculation | ||
258 | * @eccbytes: [INTERN] number of ecc bytes per ecc-calculation step | ||
259 | * @eccsteps: [INTERN] number of ecc calculation steps per page | ||
260 | * @chip_delay: [BOARDSPECIFIC] chip dependent delay for transfering data from array to read regs (tR) | ||
261 | * @chip_lock: [INTERN] spinlock used to protect access to this structure and the chip | ||
262 | * @wq: [INTERN] wait queue to sleep on if a NAND operation is in progress | ||
263 | * @state: [INTERN] the current state of the NAND device | ||
264 | * @page_shift: [INTERN] number of address bits in a page (column address bits) | ||
265 | * @phys_erase_shift: [INTERN] number of address bits in a physical eraseblock | ||
266 | * @bbt_erase_shift: [INTERN] number of address bits in a bbt entry | ||
267 | * @chip_shift: [INTERN] number of address bits in one chip | ||
268 | * @data_buf: [INTERN] internal buffer for one page + oob | ||
269 | * @oob_buf: [INTERN] oob buffer for one eraseblock | ||
270 | * @oobdirty: [INTERN] indicates that oob_buf must be reinitialized | ||
271 | * @data_poi: [INTERN] pointer to a data buffer | ||
272 | * @options: [BOARDSPECIFIC] various chip options. They can partly be set to inform nand_scan about | ||
273 | * special functionality. See the defines for further explanation | ||
274 | * @badblockpos: [INTERN] position of the bad block marker in the oob area | ||
275 | * @numchips: [INTERN] number of physical chips | ||
276 | * @chipsize: [INTERN] the size of one chip for multichip arrays | ||
277 | * @pagemask: [INTERN] page number mask = number of (pages / chip) - 1 | ||
278 | * @pagebuf: [INTERN] holds the pagenumber which is currently in data_buf | ||
279 | * @autooob: [REPLACEABLE] the default (auto)placement scheme | ||
280 | * @bbt: [INTERN] bad block table pointer | ||
281 | * @bbt_td: [REPLACEABLE] bad block table descriptor for flash lookup | ||
282 | * @bbt_md: [REPLACEABLE] bad block table mirror descriptor | ||
283 | * @badblock_pattern: [REPLACEABLE] bad block scan pattern used for initial bad block scan | ||
284 | * @controller: [OPTIONAL] a pointer to a hardware controller structure which is shared among multiple independend devices | ||
285 | * @priv: [OPTIONAL] pointer to private chip date | ||
286 | */ | ||
287 | |||
288 | struct nand_chip { | ||
289 | void __iomem *IO_ADDR_R; | ||
290 | void __iomem *IO_ADDR_W; | ||
291 | |||
292 | u_char (*read_byte)(struct mtd_info *mtd); | ||
293 | void (*write_byte)(struct mtd_info *mtd, u_char byte); | ||
294 | u16 (*read_word)(struct mtd_info *mtd); | ||
295 | void (*write_word)(struct mtd_info *mtd, u16 word); | ||
296 | |||
297 | void (*write_buf)(struct mtd_info *mtd, const u_char *buf, int len); | ||
298 | void (*read_buf)(struct mtd_info *mtd, u_char *buf, int len); | ||
299 | int (*verify_buf)(struct mtd_info *mtd, const u_char *buf, int len); | ||
300 | void (*select_chip)(struct mtd_info *mtd, int chip); | ||
301 | int (*block_bad)(struct mtd_info *mtd, loff_t ofs, int getchip); | ||
302 | int (*block_markbad)(struct mtd_info *mtd, loff_t ofs); | ||
303 | void (*hwcontrol)(struct mtd_info *mtd, int cmd); | ||
304 | int (*dev_ready)(struct mtd_info *mtd); | ||
305 | void (*cmdfunc)(struct mtd_info *mtd, unsigned command, int column, int page_addr); | ||
306 | int (*waitfunc)(struct mtd_info *mtd, struct nand_chip *this, int state); | ||
307 | int (*calculate_ecc)(struct mtd_info *mtd, const u_char *dat, u_char *ecc_code); | ||
308 | int (*correct_data)(struct mtd_info *mtd, u_char *dat, u_char *read_ecc, u_char *calc_ecc); | ||
309 | void (*enable_hwecc)(struct mtd_info *mtd, int mode); | ||
310 | void (*erase_cmd)(struct mtd_info *mtd, int page); | ||
311 | int (*scan_bbt)(struct mtd_info *mtd); | ||
312 | int eccmode; | ||
313 | int eccsize; | ||
314 | int eccbytes; | ||
315 | int eccsteps; | ||
316 | int chip_delay; | ||
317 | spinlock_t chip_lock; | ||
318 | wait_queue_head_t wq; | ||
319 | nand_state_t state; | ||
320 | int page_shift; | ||
321 | int phys_erase_shift; | ||
322 | int bbt_erase_shift; | ||
323 | int chip_shift; | ||
324 | u_char *data_buf; | ||
325 | u_char *oob_buf; | ||
326 | int oobdirty; | ||
327 | u_char *data_poi; | ||
328 | unsigned int options; | ||
329 | int badblockpos; | ||
330 | int numchips; | ||
331 | unsigned long chipsize; | ||
332 | int pagemask; | ||
333 | int pagebuf; | ||
334 | struct nand_oobinfo *autooob; | ||
335 | uint8_t *bbt; | ||
336 | struct nand_bbt_descr *bbt_td; | ||
337 | struct nand_bbt_descr *bbt_md; | ||
338 | struct nand_bbt_descr *badblock_pattern; | ||
339 | struct nand_hw_control *controller; | ||
340 | void *priv; | ||
341 | }; | ||
342 | |||
343 | /* | ||
344 | * NAND Flash Manufacturer ID Codes | ||
345 | */ | ||
346 | #define NAND_MFR_TOSHIBA 0x98 | ||
347 | #define NAND_MFR_SAMSUNG 0xec | ||
348 | #define NAND_MFR_FUJITSU 0x04 | ||
349 | #define NAND_MFR_NATIONAL 0x8f | ||
350 | #define NAND_MFR_RENESAS 0x07 | ||
351 | #define NAND_MFR_STMICRO 0x20 | ||
352 | |||
353 | /** | ||
354 | * struct nand_flash_dev - NAND Flash Device ID Structure | ||
355 | * | ||
356 | * @name: Identify the device type | ||
357 | * @id: device ID code | ||
358 | * @pagesize: Pagesize in bytes. Either 256 or 512 or 0 | ||
359 | * If the pagesize is 0, then the real pagesize | ||
360 | * and the eraseize are determined from the | ||
361 | * extended id bytes in the chip | ||
362 | * @erasesize: Size of an erase block in the flash device. | ||
363 | * @chipsize: Total chipsize in Mega Bytes | ||
364 | * @options: Bitfield to store chip relevant options | ||
365 | */ | ||
366 | struct nand_flash_dev { | ||
367 | char *name; | ||
368 | int id; | ||
369 | unsigned long pagesize; | ||
370 | unsigned long chipsize; | ||
371 | unsigned long erasesize; | ||
372 | unsigned long options; | ||
373 | }; | ||
374 | |||
375 | /** | ||
376 | * struct nand_manufacturers - NAND Flash Manufacturer ID Structure | ||
377 | * @name: Manufacturer name | ||
378 | * @id: manufacturer ID code of device. | ||
379 | */ | ||
380 | struct nand_manufacturers { | ||
381 | int id; | ||
382 | char * name; | ||
383 | }; | ||
384 | |||
385 | extern struct nand_flash_dev nand_flash_ids[]; | ||
386 | extern struct nand_manufacturers nand_manuf_ids[]; | ||
387 | |||
388 | /** | ||
389 | * struct nand_bbt_descr - bad block table descriptor | ||
390 | * @options: options for this descriptor | ||
391 | * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE | ||
392 | * when bbt is searched, then we store the found bbts pages here. | ||
393 | * Its an array and supports up to 8 chips now | ||
394 | * @offs: offset of the pattern in the oob area of the page | ||
395 | * @veroffs: offset of the bbt version counter in the oob are of the page | ||
396 | * @version: version read from the bbt page during scan | ||
397 | * @len: length of the pattern, if 0 no pattern check is performed | ||
398 | * @maxblocks: maximum number of blocks to search for a bbt. This number of | ||
399 | * blocks is reserved at the end of the device where the tables are | ||
400 | * written. | ||
401 | * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than | ||
402 | * bad) block in the stored bbt | ||
403 | * @pattern: pattern to identify bad block table or factory marked good / | ||
404 | * bad blocks, can be NULL, if len = 0 | ||
405 | * | ||
406 | * Descriptor for the bad block table marker and the descriptor for the | ||
407 | * pattern which identifies good and bad blocks. The assumption is made | ||
408 | * that the pattern and the version count are always located in the oob area | ||
409 | * of the first block. | ||
410 | */ | ||
411 | struct nand_bbt_descr { | ||
412 | int options; | ||
413 | int pages[NAND_MAX_CHIPS]; | ||
414 | int offs; | ||
415 | int veroffs; | ||
416 | uint8_t version[NAND_MAX_CHIPS]; | ||
417 | int len; | ||
418 | int maxblocks; | ||
419 | int reserved_block_code; | ||
420 | uint8_t *pattern; | ||
421 | }; | ||
422 | |||
423 | /* Options for the bad block table descriptors */ | ||
424 | |||
425 | /* The number of bits used per block in the bbt on the device */ | ||
426 | #define NAND_BBT_NRBITS_MSK 0x0000000F | ||
427 | #define NAND_BBT_1BIT 0x00000001 | ||
428 | #define NAND_BBT_2BIT 0x00000002 | ||
429 | #define NAND_BBT_4BIT 0x00000004 | ||
430 | #define NAND_BBT_8BIT 0x00000008 | ||
431 | /* The bad block table is in the last good block of the device */ | ||
432 | #define NAND_BBT_LASTBLOCK 0x00000010 | ||
433 | /* The bbt is at the given page, else we must scan for the bbt */ | ||
434 | #define NAND_BBT_ABSPAGE 0x00000020 | ||
435 | /* The bbt is at the given page, else we must scan for the bbt */ | ||
436 | #define NAND_BBT_SEARCH 0x00000040 | ||
437 | /* bbt is stored per chip on multichip devices */ | ||
438 | #define NAND_BBT_PERCHIP 0x00000080 | ||
439 | /* bbt has a version counter at offset veroffs */ | ||
440 | #define NAND_BBT_VERSION 0x00000100 | ||
441 | /* Create a bbt if none axists */ | ||
442 | #define NAND_BBT_CREATE 0x00000200 | ||
443 | /* Search good / bad pattern through all pages of a block */ | ||
444 | #define NAND_BBT_SCANALLPAGES 0x00000400 | ||
445 | /* Scan block empty during good / bad block scan */ | ||
446 | #define NAND_BBT_SCANEMPTY 0x00000800 | ||
447 | /* Write bbt if neccecary */ | ||
448 | #define NAND_BBT_WRITE 0x00001000 | ||
449 | /* Read and write back block contents when writing bbt */ | ||
450 | #define NAND_BBT_SAVECONTENT 0x00002000 | ||
451 | /* Search good / bad pattern on the first and the second page */ | ||
452 | #define NAND_BBT_SCAN2NDPAGE 0x00004000 | ||
453 | |||
454 | /* The maximum number of blocks to scan for a bbt */ | ||
455 | #define NAND_BBT_SCAN_MAXBLOCKS 4 | ||
456 | |||
457 | extern int nand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd); | ||
458 | extern int nand_update_bbt (struct mtd_info *mtd, loff_t offs); | ||
459 | extern int nand_default_bbt (struct mtd_info *mtd); | ||
460 | extern int nand_isbad_bbt (struct mtd_info *mtd, loff_t offs, int allowbbt); | ||
461 | extern int nand_erase_nand (struct mtd_info *mtd, struct erase_info *instr, int allowbbt); | ||
462 | |||
463 | /* | ||
464 | * Constants for oob configuration | ||
465 | */ | ||
466 | #define NAND_SMALL_BADBLOCK_POS 5 | ||
467 | #define NAND_LARGE_BADBLOCK_POS 0 | ||
468 | |||
469 | #endif /* __LINUX_MTD_NAND_H */ | ||