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authorKyungmin Park <kyungmin.park@samsung.com>2005-09-27 06:26:39 -0400
committerThomas Gleixner <tglx@mtd.linutronix.de>2005-11-06 16:39:23 -0500
commit87590e26ff4e7d57dfdaa81780b1b0d9e9970a4c (patch)
treeebc1fc55e3bfb46115e198d78ddb914afc5801d5 /include/linux/mtd/bbm.h
parent0255fc1b081cf92b56dfe5e1f3a824d050326614 (diff)
[MTD] OneNAND: Add missing files
Simple bad block table source and header files Signed-off-by: Kyungmin Park <kyungmin.park@samsung.com> Signed-off-by: Thomas Gleixner <tglx@linutronix.de>
Diffstat (limited to 'include/linux/mtd/bbm.h')
-rw-r--r--include/linux/mtd/bbm.h122
1 files changed, 122 insertions, 0 deletions
diff --git a/include/linux/mtd/bbm.h b/include/linux/mtd/bbm.h
new file mode 100644
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+++ b/include/linux/mtd/bbm.h
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1/*
2 * linux/include/linux/mtd/bbm.h
3 *
4 * NAND family Bad Block Management (BBM) header file
5 * - Bad Block Table (BBT) implementation
6 *
7 * Copyright (c) 2005 Samsung Electronics
8 * Kyungmin Park <kyungmin.park@samsung.com>
9 *
10 * Copyright (c) 2000-2005
11 * Thomas Gleixner <tglx@linuxtronix.de>
12 *
13 */
14#ifndef __LINUX_MTD_BBM_H
15#define __LINUX_MTD_BBM_H
16
17/* The maximum number of NAND chips in an array */
18#define NAND_MAX_CHIPS 8
19
20/**
21 * struct nand_bbt_descr - bad block table descriptor
22 * @param options options for this descriptor
23 * @param pages the page(s) where we find the bbt, used with
24 * option BBT_ABSPAGE when bbt is searched,
25 * then we store the found bbts pages here.
26 * Its an array and supports up to 8 chips now
27 * @param offs offset of the pattern in the oob area of the page
28 * @param veroffs offset of the bbt version counter in the oob are of the page
29 * @param version version read from the bbt page during scan
30 * @param len length of the pattern, if 0 no pattern check is performed
31 * @param maxblocks maximum number of blocks to search for a bbt. This number of
32 * blocks is reserved at the end of the device
33 * where the tables are written.
34 * @param reserved_block_code if non-0, this pattern denotes a reserved
35 * (rather than bad) block in the stored bbt
36 * @param pattern pattern to identify bad block table or factory marked
37 * good / bad blocks, can be NULL, if len = 0
38 *
39 * Descriptor for the bad block table marker and the descriptor for the
40 * pattern which identifies good and bad blocks. The assumption is made
41 * that the pattern and the version count are always located in the oob area
42 * of the first block.
43 */
44struct nand_bbt_descr {
45 int options;
46 int pages[NAND_MAX_CHIPS];
47 int offs;
48 int veroffs;
49 uint8_t version[NAND_MAX_CHIPS];
50 int len;
51 int maxblocks;
52 int reserved_block_code;
53 uint8_t *pattern;
54};
55
56/* Options for the bad block table descriptors */
57
58/* The number of bits used per block in the bbt on the device */
59#define NAND_BBT_NRBITS_MSK 0x0000000F
60#define NAND_BBT_1BIT 0x00000001
61#define NAND_BBT_2BIT 0x00000002
62#define NAND_BBT_4BIT 0x00000004
63#define NAND_BBT_8BIT 0x00000008
64/* The bad block table is in the last good block of the device */
65#define NAND_BBT_LASTBLOCK 0x00000010
66/* The bbt is at the given page, else we must scan for the bbt */
67#define NAND_BBT_ABSPAGE 0x00000020
68/* The bbt is at the given page, else we must scan for the bbt */
69#define NAND_BBT_SEARCH 0x00000040
70/* bbt is stored per chip on multichip devices */
71#define NAND_BBT_PERCHIP 0x00000080
72/* bbt has a version counter at offset veroffs */
73#define NAND_BBT_VERSION 0x00000100
74/* Create a bbt if none axists */
75#define NAND_BBT_CREATE 0x00000200
76/* Search good / bad pattern through all pages of a block */
77#define NAND_BBT_SCANALLPAGES 0x00000400
78/* Scan block empty during good / bad block scan */
79#define NAND_BBT_SCANEMPTY 0x00000800
80/* Write bbt if neccecary */
81#define NAND_BBT_WRITE 0x00001000
82/* Read and write back block contents when writing bbt */
83#define NAND_BBT_SAVECONTENT 0x00002000
84/* Search good / bad pattern on the first and the second page */
85#define NAND_BBT_SCAN2NDPAGE 0x00004000
86
87/* The maximum number of blocks to scan for a bbt */
88#define NAND_BBT_SCAN_MAXBLOCKS 4
89
90/*
91 * Constants for oob configuration
92 */
93#define ONENAND_BADBLOCK_POS 0
94
95/**
96 * struct bbt_info - [GENERIC] Bad Block Table data structure
97 * @param bbt_erase_shift [INTERN] number of address bits in a bbt entry
98 * @param badblockpos [INTERN] position of the bad block marker in the oob area
99 * @param bbt [INTERN] bad block table pointer
100 * @param badblock_pattern [REPLACEABLE] bad block scan pattern used for initial bad block scan
101 * @param priv [OPTIONAL] pointer to private bbm date
102 */
103struct bbm_info {
104 int bbt_erase_shift;
105 int badblockpos;
106 int options;
107
108 uint8_t *bbt;
109
110 int (*isbad_bbt)(struct mtd_info *mtd, loff_t ofs, int allowbbt);
111
112 /* TODO Add more NAND specific fileds */
113 struct nand_bbt_descr *badblock_pattern;
114
115 void *priv;
116};
117
118/* OneNAND BBT interface */
119extern int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd);
120extern int onenand_default_bbt(struct mtd_info *mtd);
121
122#endif /* __LINUX_MTD_BBM_H */