diff options
author | Brian Norris <computersforpeace@gmail.com> | 2011-05-31 19:31:22 -0400 |
---|---|---|
committer | Artem Bityutskiy <artem.bityutskiy@intel.com> | 2011-09-11 08:01:56 -0400 |
commit | a40f73419f02e40555f692785ea1c1813d5b4c12 (patch) | |
tree | 81f3eeb517d6480d8535ac769202eb8e26de53c4 /Documentation | |
parent | 5fb1549dfc40f3b589dae560ea21535cdc5f64e0 (diff) |
mtd: nand: consolidate redundant flash-based BBT flags
This patch works with the following three flags from two headers (nand.h
and bbm.h):
(1) NAND_USE_FLASH_BBT (nand.h)
(2) NAND_USE_FLASH_BBT_NO_OOB (nand.h)
(3) NAND_BBT_NO_OOB (bbm.h)
These flags are all related and interdependent, yet they were in
different headers. Flag (2) is simply the combination of (1) and (3) and
can be eliminated.
This patch accomplishes the following:
* eliminate NAND_USE_FLASH_BBT_NO_OOB (i.e., flag (2))
* move NAND_USE_FLASH_BBT (i.e., flag (1)) to bbm.h
It's important to note that because (1) and (3) are now both found in
bbm.h, they should NOT be used in the "nand_chip.options" field.
I removed a small section from the mtdnand DocBook because it referes to
NAND_USE_FLASH_BBT in nand.h, which has been moved to bbm.h.
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Diffstat (limited to 'Documentation')
-rw-r--r-- | Documentation/DocBook/mtdnand.tmpl | 5 |
1 files changed, 1 insertions, 4 deletions
diff --git a/Documentation/DocBook/mtdnand.tmpl b/Documentation/DocBook/mtdnand.tmpl index 17910e2052ad..05cc83ea8ef7 100644 --- a/Documentation/DocBook/mtdnand.tmpl +++ b/Documentation/DocBook/mtdnand.tmpl | |||
@@ -572,7 +572,7 @@ static void board_select_chip (struct mtd_info *mtd, int chip) | |||
572 | </para> | 572 | </para> |
573 | <para> | 573 | <para> |
574 | The simplest way to activate the FLASH based bad block table support | 574 | The simplest way to activate the FLASH based bad block table support |
575 | is to set the option NAND_USE_FLASH_BBT in the option field of | 575 | is to set the option NAND_USE_FLASH_BBT in the bbt_option field of |
576 | the nand chip structure before calling nand_scan(). For AG-AND | 576 | the nand chip structure before calling nand_scan(). For AG-AND |
577 | chips is this done by default. | 577 | chips is this done by default. |
578 | This activates the default FLASH based bad block table functionality | 578 | This activates the default FLASH based bad block table functionality |
@@ -1158,9 +1158,6 @@ in this page</entry> | |||
1158 | These constants are defined in nand.h. They are ored together to describe | 1158 | These constants are defined in nand.h. They are ored together to describe |
1159 | the functionality. | 1159 | the functionality. |
1160 | <programlisting> | 1160 | <programlisting> |
1161 | /* Use a flash based bad block table. This option is parsed by the | ||
1162 | * default bad block table function (nand_default_bbt). */ | ||
1163 | #define NAND_USE_FLASH_BBT 0x00010000 | ||
1164 | /* The hw ecc generator provides a syndrome instead a ecc value on read | 1161 | /* The hw ecc generator provides a syndrome instead a ecc value on read |
1165 | * This can only work if we have the ecc bytes directly behind the | 1162 | * This can only work if we have the ecc bytes directly behind the |
1166 | * data bytes. Applies for DOC and AG-AND Renesas HW Reed Solomon generators */ | 1163 | * data bytes. Applies for DOC and AG-AND Renesas HW Reed Solomon generators */ |