diff options
author | Huang Shijie <b32955@freescale.com> | 2013-08-15 22:10:09 -0400 |
---|---|---|
committer | David Woodhouse <David.Woodhouse@intel.com> | 2013-08-30 16:38:45 -0400 |
commit | ed202940335e3f9930509025e3d75721e564baca (patch) | |
tree | 0fa28d773eb6bc31981656afb3e133c150bfb3a7 /Documentation/ABI | |
parent | f720e7ce510bf79f029be45ce200ccfce5551280 (diff) |
mtd: update the ABI document about the ecc step size
We add a new sys node for ecc step size. So update the ABI document about it.
Signed-off-by: Huang Shijie <b32955@freescale.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
[Brian: edited description, modified 'ecc_strength']
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Diffstat (limited to 'Documentation/ABI')
-rw-r--r-- | Documentation/ABI/testing/sysfs-class-mtd | 17 |
1 files changed, 14 insertions, 3 deletions
diff --git a/Documentation/ABI/testing/sysfs-class-mtd b/Documentation/ABI/testing/sysfs-class-mtd index 3105644b3bfc..bfd119ace6ad 100644 --- a/Documentation/ABI/testing/sysfs-class-mtd +++ b/Documentation/ABI/testing/sysfs-class-mtd | |||
@@ -128,9 +128,8 @@ KernelVersion: 3.4 | |||
128 | Contact: linux-mtd@lists.infradead.org | 128 | Contact: linux-mtd@lists.infradead.org |
129 | Description: | 129 | Description: |
130 | Maximum number of bit errors that the device is capable of | 130 | Maximum number of bit errors that the device is capable of |
131 | correcting within each region covering an ecc step. This will | 131 | correcting within each region covering an ECC step (see |
132 | always be a non-negative integer. Note that some devices will | 132 | ecc_step_size). This will always be a non-negative integer. |
133 | have multiple ecc steps within each writesize region. | ||
134 | 133 | ||
135 | In the case of devices lacking any ECC capability, it is 0. | 134 | In the case of devices lacking any ECC capability, it is 0. |
136 | 135 | ||
@@ -173,3 +172,15 @@ Description: | |||
173 | This is generally applicable only to NAND flash devices with ECC | 172 | This is generally applicable only to NAND flash devices with ECC |
174 | capability. It is ignored on devices lacking ECC capability; | 173 | capability. It is ignored on devices lacking ECC capability; |
175 | i.e., devices for which ecc_strength is zero. | 174 | i.e., devices for which ecc_strength is zero. |
175 | |||
176 | What: /sys/class/mtd/mtdX/ecc_step_size | ||
177 | Date: May 2013 | ||
178 | KernelVersion: 3.10 | ||
179 | Contact: linux-mtd@lists.infradead.org | ||
180 | Description: | ||
181 | The size of a single region covered by ECC, known as the ECC | ||
182 | step. Devices may have several equally sized ECC steps within | ||
183 | each writesize region. | ||
184 | |||
185 | It will always be a non-negative integer. In the case of | ||
186 | devices lacking any ECC capability, it is 0. | ||