diff options
author | Kyungmin Park <kyungmin.park@samsung.com> | 2005-09-27 06:26:39 -0400 |
---|---|---|
committer | Thomas Gleixner <tglx@mtd.linutronix.de> | 2005-11-06 16:39:23 -0500 |
commit | 87590e26ff4e7d57dfdaa81780b1b0d9e9970a4c (patch) | |
tree | ebc1fc55e3bfb46115e198d78ddb914afc5801d5 | |
parent | 0255fc1b081cf92b56dfe5e1f3a824d050326614 (diff) |
[MTD] OneNAND: Add missing files
Simple bad block table source and header files
Signed-off-by: Kyungmin Park <kyungmin.park@samsung.com>
Signed-off-by: Thomas Gleixner <tglx@linutronix.de>
-rw-r--r-- | drivers/mtd/onenand/onenand_bbt.c | 246 | ||||
-rw-r--r-- | include/linux/mtd/bbm.h | 122 |
2 files changed, 368 insertions, 0 deletions
diff --git a/drivers/mtd/onenand/onenand_bbt.c b/drivers/mtd/onenand/onenand_bbt.c new file mode 100644 index 000000000000..f40190f499e1 --- /dev/null +++ b/drivers/mtd/onenand/onenand_bbt.c | |||
@@ -0,0 +1,246 @@ | |||
1 | /* | ||
2 | * linux/drivers/mtd/onenand/onenand_bbt.c | ||
3 | * | ||
4 | * Bad Block Table support for the OneNAND driver | ||
5 | * | ||
6 | * Copyright(c) 2005 Samsung Electronics | ||
7 | * Kyungmin Park <kyungmin.park@samsung.com> | ||
8 | * | ||
9 | * Derived from nand_bbt.c | ||
10 | * | ||
11 | * TODO: | ||
12 | * Split BBT core and chip specific BBT. | ||
13 | */ | ||
14 | |||
15 | #include <linux/slab.h> | ||
16 | #include <linux/mtd/mtd.h> | ||
17 | #include <linux/mtd/onenand.h> | ||
18 | #include <linux/mtd/compatmac.h> | ||
19 | |||
20 | /** | ||
21 | * check_short_pattern - [GENERIC] check if a pattern is in the buffer | ||
22 | * @param buf the buffer to search | ||
23 | * @param len the length of buffer to search | ||
24 | * @param paglen the pagelength | ||
25 | * @param td search pattern descriptor | ||
26 | * | ||
27 | * Check for a pattern at the given place. Used to search bad block | ||
28 | * tables and good / bad block identifiers. Same as check_pattern, but | ||
29 | * no optional empty check and the pattern is expected to start | ||
30 | * at offset 0. | ||
31 | * | ||
32 | */ | ||
33 | static int check_short_pattern(uint8_t *buf, int len, int paglen, struct nand_bbt_descr *td) | ||
34 | { | ||
35 | int i; | ||
36 | uint8_t *p = buf; | ||
37 | |||
38 | /* Compare the pattern */ | ||
39 | for (i = 0; i < td->len; i++) { | ||
40 | if (p[i] != td->pattern[i]) | ||
41 | return -1; | ||
42 | } | ||
43 | return 0; | ||
44 | } | ||
45 | |||
46 | /** | ||
47 | * create_bbt - [GENERIC] Create a bad block table by scanning the device | ||
48 | * @param mtd MTD device structure | ||
49 | * @param buf temporary buffer | ||
50 | * @param bd descriptor for the good/bad block search pattern | ||
51 | * @param chip create the table for a specific chip, -1 read all chips. | ||
52 | * Applies only if NAND_BBT_PERCHIP option is set | ||
53 | * | ||
54 | * Create a bad block table by scanning the device | ||
55 | * for the given good/bad block identify pattern | ||
56 | */ | ||
57 | static int create_bbt(struct mtd_info *mtd, uint8_t *buf, struct nand_bbt_descr *bd, int chip) | ||
58 | { | ||
59 | struct onenand_chip *this = mtd->priv; | ||
60 | struct bbm_info *bbm = this->bbm; | ||
61 | int i, j, numblocks, len, scanlen; | ||
62 | int startblock; | ||
63 | loff_t from; | ||
64 | size_t readlen, ooblen; | ||
65 | |||
66 | printk(KERN_INFO "Scanning device for bad blocks\n"); | ||
67 | |||
68 | len = 1; | ||
69 | |||
70 | /* We need only read few bytes from the OOB area */ | ||
71 | scanlen = ooblen = 0; | ||
72 | readlen = bd->len; | ||
73 | |||
74 | /* chip == -1 case only */ | ||
75 | /* Note that numblocks is 2 * (real numblocks) here; | ||
76 | * see i += 2 below as it makses shifting and masking less painful | ||
77 | */ | ||
78 | numblocks = mtd->size >> (bbm->bbt_erase_shift - 1); | ||
79 | startblock = 0; | ||
80 | from = 0; | ||
81 | |||
82 | for (i = startblock; i < numblocks; ) { | ||
83 | int ret; | ||
84 | |||
85 | for (j = 0; j < len; j++) { | ||
86 | size_t retlen; | ||
87 | |||
88 | /* No need to read pages fully, | ||
89 | * just read required OOB bytes */ | ||
90 | ret = mtd->read_oob(mtd, from + j * mtd->oobblock + bd->offs, | ||
91 | readlen, &retlen, &buf[0]); | ||
92 | |||
93 | if (ret) | ||
94 | return ret; | ||
95 | |||
96 | if (check_short_pattern(&buf[j * scanlen], scanlen, mtd->oobblock, bd)) { | ||
97 | bbm->bbt[i >> 3] |= 0x03 << (i & 0x6); | ||
98 | printk(KERN_WARNING "Bad eraseblock %d at 0x%08x\n", | ||
99 | i >> 1, (unsigned int) from); | ||
100 | break; | ||
101 | } | ||
102 | } | ||
103 | i += 2; | ||
104 | from += (1 << bbm->bbt_erase_shift); | ||
105 | } | ||
106 | |||
107 | return 0; | ||
108 | } | ||
109 | |||
110 | |||
111 | /** | ||
112 | * onenand_memory_bbt - [GENERIC] create a memory based bad block table | ||
113 | * @param mtd MTD device structure | ||
114 | * @param bd descriptor for the good/bad block search pattern | ||
115 | * | ||
116 | * The function creates a memory based bbt by scanning the device | ||
117 | * for manufacturer / software marked good / bad blocks | ||
118 | */ | ||
119 | static inline int onenand_memory_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd) | ||
120 | { | ||
121 | unsigned char data_buf[MAX_ONENAND_PAGESIZE]; | ||
122 | |||
123 | bd->options &= ~NAND_BBT_SCANEMPTY; | ||
124 | return create_bbt(mtd, data_buf, bd, -1); | ||
125 | } | ||
126 | |||
127 | /** | ||
128 | * onenand_isbad_bbt - [OneNAND Interface] Check if a block is bad | ||
129 | * @param mtd MTD device structure | ||
130 | * @param offs offset in the device | ||
131 | * @param allowbbt allow access to bad block table region | ||
132 | */ | ||
133 | static int onenand_isbad_bbt(struct mtd_info *mtd, loff_t offs, int allowbbt) | ||
134 | { | ||
135 | struct onenand_chip *this = mtd->priv; | ||
136 | struct bbm_info *bbm = this->bbm; | ||
137 | int block; | ||
138 | uint8_t res; | ||
139 | |||
140 | /* Get block number * 2 */ | ||
141 | block = (int) (offs >> (bbm->bbt_erase_shift - 1)); | ||
142 | res = (bbm->bbt[block >> 3] >> (block & 0x06)) & 0x03; | ||
143 | |||
144 | DEBUG(MTD_DEBUG_LEVEL2, "onenand_isbad_bbt: bbt info for offs 0x%08x: (block %d) 0x%02x\n", | ||
145 | (unsigned int) offs, block >> 1, res); | ||
146 | |||
147 | switch ((int) res) { | ||
148 | case 0x00: return 0; | ||
149 | case 0x01: return 1; | ||
150 | case 0x02: return allowbbt ? 0 : 1; | ||
151 | } | ||
152 | |||
153 | return 1; | ||
154 | } | ||
155 | |||
156 | /** | ||
157 | * onenand_scan_bbt - [OneNAND Interface] scan, find, read and maybe create bad block table(s) | ||
158 | * @param mtd MTD device structure | ||
159 | * @param bd descriptor for the good/bad block search pattern | ||
160 | * | ||
161 | * The function checks, if a bad block table(s) is/are already | ||
162 | * available. If not it scans the device for manufacturer | ||
163 | * marked good / bad blocks and writes the bad block table(s) to | ||
164 | * the selected place. | ||
165 | * | ||
166 | * The bad block table memory is allocated here. It must be freed | ||
167 | * by calling the onenand_free_bbt function. | ||
168 | * | ||
169 | */ | ||
170 | int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd) | ||
171 | { | ||
172 | struct onenand_chip *this = mtd->priv; | ||
173 | struct bbm_info *bbm = this->bbm; | ||
174 | int len, ret = 0; | ||
175 | |||
176 | len = mtd->size >> (this->erase_shift + 2); | ||
177 | /* Allocate memory (2bit per block) */ | ||
178 | bbm->bbt = kmalloc(len, GFP_KERNEL); | ||
179 | if (!bbm->bbt) { | ||
180 | printk(KERN_ERR "onenand_scan_bbt: Out of memory\n"); | ||
181 | return -ENOMEM; | ||
182 | } | ||
183 | /* Clear the memory bad block table */ | ||
184 | memset(bbm->bbt, 0x00, len); | ||
185 | |||
186 | /* Set the bad block position */ | ||
187 | bbm->badblockpos = ONENAND_BADBLOCK_POS; | ||
188 | |||
189 | /* Set erase shift */ | ||
190 | bbm->bbt_erase_shift = this->erase_shift; | ||
191 | |||
192 | if (!bbm->isbad_bbt) | ||
193 | bbm->isbad_bbt = onenand_isbad_bbt; | ||
194 | |||
195 | /* Scan the device to build a memory based bad block table */ | ||
196 | if ((ret = onenand_memory_bbt(mtd, bd))) { | ||
197 | printk(KERN_ERR "onenand_scan_bbt: Can't scan flash and build the RAM-based BBT\n"); | ||
198 | kfree(bbm->bbt); | ||
199 | bbm->bbt = NULL; | ||
200 | } | ||
201 | |||
202 | return ret; | ||
203 | } | ||
204 | |||
205 | /* | ||
206 | * Define some generic bad / good block scan pattern which are used | ||
207 | * while scanning a device for factory marked good / bad blocks. | ||
208 | */ | ||
209 | static uint8_t scan_ff_pattern[] = { 0xff, 0xff }; | ||
210 | |||
211 | static struct nand_bbt_descr largepage_memorybased = { | ||
212 | .options = 0, | ||
213 | .offs = 0, | ||
214 | .len = 2, | ||
215 | .pattern = scan_ff_pattern, | ||
216 | }; | ||
217 | |||
218 | /** | ||
219 | * onenand_default_bbt - [OneNAND Interface] Select a default bad block table for the device | ||
220 | * @param mtd MTD device structure | ||
221 | * | ||
222 | * This function selects the default bad block table | ||
223 | * support for the device and calls the onenand_scan_bbt function | ||
224 | */ | ||
225 | int onenand_default_bbt(struct mtd_info *mtd) | ||
226 | { | ||
227 | struct onenand_chip *this = mtd->priv; | ||
228 | struct bbm_info *bbm; | ||
229 | |||
230 | this->bbm = kmalloc(sizeof(struct bbm_info), GFP_KERNEL); | ||
231 | if (!this->bbm) | ||
232 | return -ENOMEM; | ||
233 | |||
234 | bbm = this->bbm; | ||
235 | |||
236 | memset(bbm, 0, sizeof(struct bbm_info)); | ||
237 | |||
238 | /* 1KB page has same configuration as 2KB page */ | ||
239 | if (!bbm->badblock_pattern) | ||
240 | bbm->badblock_pattern = &largepage_memorybased; | ||
241 | |||
242 | return onenand_scan_bbt(mtd, bbm->badblock_pattern); | ||
243 | } | ||
244 | |||
245 | EXPORT_SYMBOL(onenand_scan_bbt); | ||
246 | EXPORT_SYMBOL(onenand_default_bbt); | ||
diff --git a/include/linux/mtd/bbm.h b/include/linux/mtd/bbm.h new file mode 100644 index 000000000000..92b42cb7ed2e --- /dev/null +++ b/include/linux/mtd/bbm.h | |||
@@ -0,0 +1,122 @@ | |||
1 | /* | ||
2 | * linux/include/linux/mtd/bbm.h | ||
3 | * | ||
4 | * NAND family Bad Block Management (BBM) header file | ||
5 | * - Bad Block Table (BBT) implementation | ||
6 | * | ||
7 | * Copyright (c) 2005 Samsung Electronics | ||
8 | * Kyungmin Park <kyungmin.park@samsung.com> | ||
9 | * | ||
10 | * Copyright (c) 2000-2005 | ||
11 | * Thomas Gleixner <tglx@linuxtronix.de> | ||
12 | * | ||
13 | */ | ||
14 | #ifndef __LINUX_MTD_BBM_H | ||
15 | #define __LINUX_MTD_BBM_H | ||
16 | |||
17 | /* The maximum number of NAND chips in an array */ | ||
18 | #define NAND_MAX_CHIPS 8 | ||
19 | |||
20 | /** | ||
21 | * struct nand_bbt_descr - bad block table descriptor | ||
22 | * @param options options for this descriptor | ||
23 | * @param pages the page(s) where we find the bbt, used with | ||
24 | * option BBT_ABSPAGE when bbt is searched, | ||
25 | * then we store the found bbts pages here. | ||
26 | * Its an array and supports up to 8 chips now | ||
27 | * @param offs offset of the pattern in the oob area of the page | ||
28 | * @param veroffs offset of the bbt version counter in the oob are of the page | ||
29 | * @param version version read from the bbt page during scan | ||
30 | * @param len length of the pattern, if 0 no pattern check is performed | ||
31 | * @param maxblocks maximum number of blocks to search for a bbt. This number of | ||
32 | * blocks is reserved at the end of the device | ||
33 | * where the tables are written. | ||
34 | * @param reserved_block_code if non-0, this pattern denotes a reserved | ||
35 | * (rather than bad) block in the stored bbt | ||
36 | * @param pattern pattern to identify bad block table or factory marked | ||
37 | * good / bad blocks, can be NULL, if len = 0 | ||
38 | * | ||
39 | * Descriptor for the bad block table marker and the descriptor for the | ||
40 | * pattern which identifies good and bad blocks. The assumption is made | ||
41 | * that the pattern and the version count are always located in the oob area | ||
42 | * of the first block. | ||
43 | */ | ||
44 | struct nand_bbt_descr { | ||
45 | int options; | ||
46 | int pages[NAND_MAX_CHIPS]; | ||
47 | int offs; | ||
48 | int veroffs; | ||
49 | uint8_t version[NAND_MAX_CHIPS]; | ||
50 | int len; | ||
51 | int maxblocks; | ||
52 | int reserved_block_code; | ||
53 | uint8_t *pattern; | ||
54 | }; | ||
55 | |||
56 | /* Options for the bad block table descriptors */ | ||
57 | |||
58 | /* The number of bits used per block in the bbt on the device */ | ||
59 | #define NAND_BBT_NRBITS_MSK 0x0000000F | ||
60 | #define NAND_BBT_1BIT 0x00000001 | ||
61 | #define NAND_BBT_2BIT 0x00000002 | ||
62 | #define NAND_BBT_4BIT 0x00000004 | ||
63 | #define NAND_BBT_8BIT 0x00000008 | ||
64 | /* The bad block table is in the last good block of the device */ | ||
65 | #define NAND_BBT_LASTBLOCK 0x00000010 | ||
66 | /* The bbt is at the given page, else we must scan for the bbt */ | ||
67 | #define NAND_BBT_ABSPAGE 0x00000020 | ||
68 | /* The bbt is at the given page, else we must scan for the bbt */ | ||
69 | #define NAND_BBT_SEARCH 0x00000040 | ||
70 | /* bbt is stored per chip on multichip devices */ | ||
71 | #define NAND_BBT_PERCHIP 0x00000080 | ||
72 | /* bbt has a version counter at offset veroffs */ | ||
73 | #define NAND_BBT_VERSION 0x00000100 | ||
74 | /* Create a bbt if none axists */ | ||
75 | #define NAND_BBT_CREATE 0x00000200 | ||
76 | /* Search good / bad pattern through all pages of a block */ | ||
77 | #define NAND_BBT_SCANALLPAGES 0x00000400 | ||
78 | /* Scan block empty during good / bad block scan */ | ||
79 | #define NAND_BBT_SCANEMPTY 0x00000800 | ||
80 | /* Write bbt if neccecary */ | ||
81 | #define NAND_BBT_WRITE 0x00001000 | ||
82 | /* Read and write back block contents when writing bbt */ | ||
83 | #define NAND_BBT_SAVECONTENT 0x00002000 | ||
84 | /* Search good / bad pattern on the first and the second page */ | ||
85 | #define NAND_BBT_SCAN2NDPAGE 0x00004000 | ||
86 | |||
87 | /* The maximum number of blocks to scan for a bbt */ | ||
88 | #define NAND_BBT_SCAN_MAXBLOCKS 4 | ||
89 | |||
90 | /* | ||
91 | * Constants for oob configuration | ||
92 | */ | ||
93 | #define ONENAND_BADBLOCK_POS 0 | ||
94 | |||
95 | /** | ||
96 | * struct bbt_info - [GENERIC] Bad Block Table data structure | ||
97 | * @param bbt_erase_shift [INTERN] number of address bits in a bbt entry | ||
98 | * @param badblockpos [INTERN] position of the bad block marker in the oob area | ||
99 | * @param bbt [INTERN] bad block table pointer | ||
100 | * @param badblock_pattern [REPLACEABLE] bad block scan pattern used for initial bad block scan | ||
101 | * @param priv [OPTIONAL] pointer to private bbm date | ||
102 | */ | ||
103 | struct bbm_info { | ||
104 | int bbt_erase_shift; | ||
105 | int badblockpos; | ||
106 | int options; | ||
107 | |||
108 | uint8_t *bbt; | ||
109 | |||
110 | int (*isbad_bbt)(struct mtd_info *mtd, loff_t ofs, int allowbbt); | ||
111 | |||
112 | /* TODO Add more NAND specific fileds */ | ||
113 | struct nand_bbt_descr *badblock_pattern; | ||
114 | |||
115 | void *priv; | ||
116 | }; | ||
117 | |||
118 | /* OneNAND BBT interface */ | ||
119 | extern int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd); | ||
120 | extern int onenand_default_bbt(struct mtd_info *mtd); | ||
121 | |||
122 | #endif /* __LINUX_MTD_BBM_H */ | ||