Commit 2a6a28e7922c ("mtd: Make MTD tests cancelable") accidentally
clobbered any read failure reports.

Coverity CID #1296020

Signed-off-by: Brian Norris <computersforpeace@gmail.com>

I always go nuts when I start an MTD test on a slow device and have to
wait forever until it finishes. From the debug output I already know
what the issue is but I have to wait or reset the board hard. Resetting
is often not an option (remote access, you don't want lose the current
state, etc...).

The solution is easy, check for pending signals at key positions in the
code. Using that one can even stop a test by pressing CTRL-C as
insmod/modprobe have SIGINT pending.

Signed-off-by: Richard Weinberger <richard@nod.at>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>

In test case 3, we set vary_offset to write at different
offsets and lengths in the OOB available area. We need to
do the bitflip_limit check while checking for 0xff outside the
OOB offset + length area that we didn't modify during write.

Signed-off-by: Roger Quadros <rogerq@ti.com>
[Brian: whitespace fixup]
Signed-off-by: Brian Norris <computersforpeace@gmail.com>

Caught by Coverity (CID #200625 and others)

Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Cc: Akinobu Mita <akinobu.mita@gmail.com>

The torture test should quit once it actually induces an error in the
flash. This step was accidentally removed during refactoring.

Without this fix, the torturetest just continues infinitely, or until
the maximum cycle count is reached. e.g.:

   ...
   [ 7619.218171] mtd_test: error -5 while erasing EB 100
   [ 7619.297981] mtd_test: error -5 while erasing EB 100
   [ 7619.377953] mtd_test: error -5 while erasing EB 100
   [ 7619.457998] mtd_test: error -5 while erasing EB 100
   [ 7619.537990] mtd_test: error -5 while erasing EB 100
   ...

Fixes: 6cf78358c94f ("mtd: mtd_torturetest: use mtd_test helpers")
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Cc: Akinobu Mita <akinobu.mita@gmail.com>
Cc: <stable@vger.kernel.org>

Fixes warning:

   drivers/mtd/tests/oobtest.c: In function 'memcmpshow':
   drivers/mtd/tests/oobtest.c:129: warning: format '%x' expects type 'unsigned int', but argument 3 has type 'size_t'

Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Cc: Roger Quadros <rogerq@ti.com>
Cc: Sekhar Nori <nsekhar@ti.com>

It is common for NAND devices to have bitflip errors.
Add a bitflip_limit parameter to specify how many bitflips per
page we can tolerate without flagging an error.
By default zero bitflips are tolerated.

Signed-off-by: Roger Quadros <rogerq@ti.com>
Signed-off-by: Sekhar Nori <nsekhar@ti.com>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>

Add a function memcmpshow() that compares the 2 data buffers
and shows the address:offset and data bytes on comparison failure.
This function  does not break at a comparison failure but runs the
check for the whole data buffer.

Use memcmpshow() instead of memcmp() for all the verification paths.

Signed-off-by: Roger Quadros <rogerq@ti.com>
Signed-off-by: Sekhar Nori <nsekhar@ti.com>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>

These multiplications are done with 32-bit arithmetic, then converted to
64-bit. We should widen the integers first to prevent overflow. This
could be a problem for large (>4GB) MTD's.

Detected by Coverity.

Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Cc: Akinobu Mita <akinobu.mita@gmail.com>

mtd_oobtest writes OOB, read it back and verify.  The verification is
not correctly done if oobsize is not multiple of 4.  Although the data
to be written and the data to be compared are generated by several
prandom_byte_state() calls starting with the same seed, these two are
generated with the different size and different number of calls.

Due to the implementation of prandom_byte_state() if the size on each
call is not multiple of 4, the resulting data is not always same.

This fixes it by just calling prandom_byte_state() once and using
correct range instead of calling it multiple times for each.

Reported-by: George Cherian <george.cherian@ti.com>
Reported-by: Lothar Waßmann <LW@KARO-electronics.de>
Tested-by: Lothar Waßmann <LW@KARO-electronics.de>
Cc: George Cherian <george.cherian@ti.com>
Cc: Lothar Waßmann <LW@KARO-electronics.de>
Cc: David Woodhouse <dwmw2@infradead.org>
Cc: Lee Jones <lee.jones@linaro.org>
Cc: linux-mtd@lists.infradead.org
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>